A tuning fork based wide range mechanical characterization tool with nanorobotic manipulators inside a scanning electron microscope.

نویسندگان

  • Juan Camilo Acosta
  • Gilgueng Hwang
  • Jérôme Polesel-Maris
  • Stéphane Régnier
چکیده

This study proposes a tuning fork probe based nanomanipulation robotic system for mechanical characterization of ultraflexible nanostructures under scanning electron microscope. The force gradient is measured via the frequency modulation of a quartz tuning fork and two nanomanipulators are used for manipulation of the nanostructures. Two techniques are proposed for attaching the nanostructure to the tip of the tuning fork probe. The first technique involves gluing the nanostructure for full range characterization whereas the second technique uses van der Waals and electrostatic forces in order to avoid destroying the nanostructure. Helical nanobelts (HNB) are proposed for the demonstration of the setup. The nonlinear stiffness behavior of HNBs during their full range tensile studies is clearly revealed for the first time. Using the first technique, this was between 0.009 N/m for rest position and 0.297 N/m before breaking of the HNB with a resolution of 0.0031 N/m. For the second experiment, this was between 0.014 N/m for rest position and 0.378 N/m before detaching of the HNB with a resolution of 0.0006 N/m. This shows the wide range sensing of the system for potential applications in mechanical property characterization of ultraflexible nanostructures.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Nanomanipulation and Nanoassembly of Carbon Nanotubes Inside Electron Microscopes

We report nanomanipulation and nanoassembly of carbon nanotubes (CNTs) through nanorobotic manipulation inside electron microscopes. A hybrid nanorobotic manipulation system, which is integrated with a nanorobotic manipulator inside a transmission electron microscope (TEM) and nanorobotic manipulators inside a scanning electron microscope (SEM), is used. The elasticity of a multiwalled CNT (MWN...

متن کامل

Assembly of Nanodevices With Carbon Nanotubes Through Nanorobotic Manipulations

Properties and potential applications of carbon nanotubes are summarized by emphasizing the aspects of nanoelectronics and nanoelectromechanical systems (NEMS). The main technologies for the assembly of nanodevices through nanomanipulations with scanning probe microscopes and nanorobotic manipulators are overviewed, focusing on that of nanotubes. Key techniques for nanoassembly include the prep...

متن کامل

Piezoresistive InGaAs/GaAs nanosprings with metal connectors.

This paper presents the fabrication, assembly, and characterization of piezoresistive nanosprings for creating nanoelectromechanical systems. The fabrication process is based on conventional microfabrication techniques to create a planar pattern in a 27nm thick, n-type InGaAs/GaAs bilayer that self-forms into three-dimensional structures during a wet etch release. As the nanosprings have lower ...

متن کامل

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • The Review of scientific instruments

دوره 82 3  شماره 

صفحات  -

تاریخ انتشار 2011